Physically-enforced time-limited cores and method of operation

Electronic digital logic circuitry – Multifunctional or programmable – Having details of setting or programming of interconnections...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C326S008000

Reexamination Certificate

active

11067423

ABSTRACT:
A programmable logic device may comprise a metric circuit operable to repeatedly perform a function and emit a first signal dependent upon its advancement into the function. A comparator may compare the first signal from the metric circuit to a predetermined reference signal. A controller may then selectively disable a portion of the programmable logic device dependent upon the results of the comparison. In a particular case, the weakened circuit may be a counter that repeatedly advances its count with a rate dependent upon an aging characteristic of a vulnerable element.

REFERENCES:
patent: 6173235 (2001-01-01), Maeda
patent: 6198301 (2001-03-01), Chetlur et al.
patent: 2006/0049886 (2006-03-01), Agostinelli et al.
“The Controversial Bits”, Sep. 24, 2004, p. 1 of 1, available from http://people.freenet.de/s.urfer/conditioning.htm.
“Hot Electron Effects”, Specific Concerns in Space Applications, Jul. 9, 2004, p. 1 of 1, available from http:/
epp
asa.gov/index—nasa.cfm/909/.
Clement, J.J. et al., “Methodology for Electromigration Critical Threshold Design Rule Evaluation”, 2004, p. 1 of 1, available from http://ieeexplore.ieee.org/xpl/abs—free.jsp?arNumber=759073, no month.
Watts, Joe et al., “Hot Electron Degredation in SOI MOSFETs”, Annual Research Summary Section 8, Jul. 1, 1994-Jun. 30, 1995, p. 1 of 1, available from http://dynamo.ecn.purdue.edu/ECE/Research/ARS/ARS95/Sec8/8—24.html.
Luryi, Serge et al., “Hot Electron Injection Devices”, Nov. 27, 1984, Superlattices and Microstructures, vol. 1, No. 5, 1985, pp. 389-400, available from AT&T Bell Laboratories, Murray Hill, N.J. 07974 or Bell Communication Research, Murray Hill, N.J. 07974.
Gladkikh, A. et al., “Correlation Between Electromigration Damage Kinetics and Microstructure In Cu Interconnects”, 1995, pp. -4, available from Department of Physical Electronics, Tel Aviv University, Ramat Aviv 69978, Israel, no month.
“Electromigration”, pp. 1-4, available from http://en.wikipedia.org/wiki/Electromigration, no date.
Peter, Laura, “Early Failures are Key in Copper Electromigration”, Semiconductor International, Jul. 1, 2002, p. 1 of 1, available from http://www.keepmedia.com:/jsp/article—detail—print.jsp.
Sanches, Julian J., “Hot-Electron Resistant Device Processing and Design: A Review”, 1989, pp. 1-8, available from IEEE, 3 Park Avenue, 17th Floor, New York, NY 10016-5997, no month.
“Choosing the Right Silicon Solution”, EETimes, Sep. 27, 2004, pp. 1-3, available from Electronic Engineering Times, at http://www.eetimes.com.
Sullivan, Tim, “Electromigration”, IBM Microelectronics, available from http://www.irps.org/irw/99/Tuts.htm, no date.
Chang, Chih-Wei (Jim), “Layout-Driven Hot-Carrier Degradation Minimization Using Logic Restructuring Techniques”, 2001, pp. 1-6, available from Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA 93106, no month.
Lloyd, J.R., “Electromigration for Designers: An Introduction for the Non-Specialist”, IBM TJ Watson Research Center, Apr. 12, 2002, pp. 1-9, available at http://www.techonline.com/community/home/20421.
“Reliability in CMOS IC Design: Physical Failure Mechanisms and their Modeling”, pp. 1-8, available from http://www.mosis.org/Fags/tech—cmos—rel.pdf, no date.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Physically-enforced time-limited cores and method of operation does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Physically-enforced time-limited cores and method of operation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Physically-enforced time-limited cores and method of operation will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3857992

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.