Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Reexamination Certificate
2006-03-07
2006-03-07
Ghyka, Alexander (Department: 2812)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
C438S781000, C430S192000, C430S319000, C430S330000
Reexamination Certificate
active
07008883
ABSTRACT:
A photoresist composition comprising (A) a resin soluble in an alkali, (B) an ester of a quinonediazidesulfonic acid, (C) a thermosetting component and an organic solvent; an insulation film for organic EL devices which is formed by heating a resist film formed with the composition on a substrate in accordance with photolithography, has a sectional shape having upper edge portions having a round shape and the width increasing towards the bottom portion and has a thickness is in the range of 0.3 to 3 μm; and a process for producing the insulation film using the photoresist composition. The photoresist composition, the insulation film for organic EL devices and the process for producing the insulation film provide an insulation film having a sectional shape advantageous for an insulation film for organic EL devices since the width in the sectional shape of the film increases towards the bottom portion.
REFERENCES:
patent: 5905117 (1999-05-01), Yokotsuka et al.
patent: 6329295 (2001-12-01), Matsubara et al.
patent: 6372628 (2002-04-01), Matsubara et al.
patent: 6800538 (2004-10-01), Furuhashi et al.
patent: 6819041 (2004-11-01), Kajiwara
patent: 2003/0193624 (2003-10-01), Kobayashi et al.
patent: 0430302 (1991-06-01), None
patent: 0520626 (1992-12-01), None
patent: 4-352101 (1992-12-01), None
patent: 7-140648 (1995-06-01), None
patent: 09278849 (1997-10-01), None
patent: 09325210 (1997-12-01), None
patent: 2000-256565 (2000-09-01), None
patent: 2001-5175 (2001-01-01), None
European Search Report dated May 12, 2004.
Kashiwagi Motofumi
Mitao Noriyuki
Armstrong Kratz Quintos Hanson & Brooks, LLP
Ghyka Alexander
Zeon Corporation
LandOfFree
Photoresist composition for forming an insulation film,... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Photoresist composition for forming an insulation film,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Photoresist composition for forming an insulation film,... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3595620