Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Patent
1995-09-08
1998-02-17
Lesmes, George F.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
4302811, 4302881, 430920, 430921, 522 63, 522181, G03C 172, G03C 173, C08F 250
Patent
active
057190089
ABSTRACT:
A photoresist composition is disclosed which includes:
REFERENCES:
patent: 4388450 (1983-06-01), Crivello
patent: 4478810 (1984-10-01), Bloss et al.
patent: 4518788 (1985-05-01), Crivello
patent: 4705887 (1987-11-01), Crivello
patent: 4707588 (1987-11-01), Takazume et al.
patent: 4994346 (1991-02-01), Meier et al.
patent: 5004842 (1991-04-01), Klemarczyk et al.
patent: 5057397 (1991-10-01), Miyabe et al.
patent: 5069997 (1991-12-01), Schwalm et al.
patent: 5070117 (1991-12-01), Klemarczyk et al.
patent: 5079129 (1992-01-01), Roth et al.
patent: 5362822 (1994-11-01), Hefner, Jr.
patent: 5510540 (1996-04-01), Hozumi et al.
English translation of JP 60-71657, Watanabe et al., Apr. 1985.
English translation of JP-3-260651, Matsumura et al., Nov. 1991.
Database WPI, Week 9514, Derwent Publications Ltd., London, GB; AN 95-102684 & JP-A-07 028241 (Sumitomo Chemical Company, Ltd.), Jan. 31, 1995--Abstract.
Hozumi Shigeo
Nakagawa Hiroya
Codd Bernard P.
Lesmes George F.
Sumitomo Chemical Company Limited
LandOfFree
Photoresist composition comprising a polyfunctional vinyl ether does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Photoresist composition comprising a polyfunctional vinyl ether , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Photoresist composition comprising a polyfunctional vinyl ether will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1783103