Photomask, photomask fabrication method, pattern formation...

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

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C430S311000

Reexamination Certificate

active

07897298

ABSTRACT:
A mask pattern including a light-shielding portion101and a semi-light-shielding portion102is provided on a transparent substrate100having a transparent property against exposing light so as to be surrounded with a transparent portion104. The semi-light-shielding portion102is disposed in an outer region of the mask pattern and partially transmits the exposing light in an identical phase to the exposing light passing through the transparent portion104.

REFERENCES:
patent: 5281500 (1994-01-01), Cathey et al.
patent: 2002/0155362 (2002-10-01), Heissmeier et al.
patent: 2004/0081899 (2004-04-01), Misaka
patent: 2004/0121244 (2004-06-01), Misaka
patent: 2004/0161678 (2004-08-01), Misaka
patent: 2004/0265708 (2004-12-01), Misaka
patent: 2006/0121366 (2006-06-01), Misaka
patent: 5-197130 (1993-08-01), None
patent: 5-297565 (1993-11-01), None
patent: 7-271013 (1995-10-01), None
patent: 08-292550 (1996-11-01), None
patent: 09-127677 (1997-05-01), None
patent: 2006-201434 (2006-08-01), None
patent: 2007-41024 (2007-02-01), None
patent: 2007-72451 (2007-03-01), None
patent: WO 03/062923 (2003-07-01), None
Japanese Office Action, with English Translation, issued in Japanese Patent Application No. JP 2007-528495 dated on Sep. 2, 2008.

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