Photoetching method

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

29580, 156646, 156656, 156657, 1566591, 357 67, 427 88, 430313, 430315, 430318, H01L 21306, C23F 102

Patent

active

043211046

ABSTRACT:
In forming an interconnection pattern on a silicon substrate, an Al-Si alloy is used as an interconnection material, a silicon film is deposited on the Al-Si alloy film, and a photoresist layer is applied and thereafter exposed to light to provide a photoresist pattern to serve as a mask for subsequent etching of the Al-Si alloy film.
Thus, the generation of standing waves due to reflection at the exposure is prevented, a microscopic interconnection pattern is precisely formed, and neither the junction-through due to a heat treatment nor a degradation in the bonding characteristics occurs.

REFERENCES:
patent: 3609470 (1971-09-01), Kuiper
patent: 3881971 (1975-05-01), Greer et al.
patent: 4062720 (1977-12-01), Alcorn et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Photoetching method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Photoetching method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Photoetching method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1649517

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.