Semiconductor device manufacturing: process – Quantum dots and lines
Reexamination Certificate
2005-04-26
2005-04-26
Pert, Evan (Department: 2829)
Semiconductor device manufacturing: process
Quantum dots and lines
C216S103000
Reexamination Certificate
active
06884740
ABSTRACT:
Photoelectrochemical (PEC) etching is restricted to a group III nitride semiconductor-barrier interface to laterally etch or undercut the target group III nitride. The barrier interface is provided by the transparent sapphire substrate on which the target group III nitride is epitaxially grown or by a layer of material in intimate contact with the target group III nitride material and having a bandgap sufficiently high to make it resistant to PEC etching. Due to the first orientation in which this effect was first observed, it has been named backside-Illuminated photoelectrochemical (BIPEC) etching. It refers to a preferential etching at the semiconductor-barrier layer interface. The assembly can be exposed to light from any direction to effectuate bandgap-selective PEC etching. An opaque mask can be applied to limit the lateral extent of the photoelectrochemical etching.
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Hu Evelyn L.
Stonas Andreas R.
Fulbright & Jaworski
Kilday Lisa
Pert Evan
The Regents of the University of California
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