Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-11-22
2005-11-22
Lin, Sun James (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
06968528
ABSTRACT:
Photo reticles (110) are formed comprising a first and second printable features (130), (140) which are connected by a channel assist feature (150). The size of the channel assist feature is such that the channel assist feature will not substantially print on photoresist that is exposed using the reticle. Third printable features (120) can be placed a distance WDfrom the channel assist feature (150). The channel assist feature will assist in the formation of the third printable feature (120).
REFERENCES:
patent: 2004/0170905 (2004-09-01), Liebmann et al.
Lu Zhijian
Sadra Kayvan
Brady III W. James
Lin Sun James
McLarty Peter K.
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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