Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate
2007-02-20
2007-02-20
Chambliss, Alonzo (Department: 2814)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
C438S197000, C257S192000, C257SE21040, C257SE21051
Reexamination Certificate
active
10943278
ABSTRACT:
A method (10) of forming a transistor (100) includes treating (12) at least some of a semiconductor substrate (102) with carbon and then forming (18) a gate structure (114) over the semiconductor substrate. A channel region (122) is thereby being defined within the semiconductor substrate (102) below the gate structure (114). Source and drain regions (140, 142) are then formed (26) within the semiconductor substrate (102) on opposing sides of the channel (122) with a phosphorus dopant.
REFERENCES:
patent: 4769686 (1988-09-01), Horiuchi et al.
patent: 5387807 (1995-02-01), Bayraktaroglu
patent: 6229197 (2001-05-01), Plumton et al.
patent: 6576535 (2003-06-01), Drobny et al.
patent: 6605498 (2003-08-01), Murthy et al.
patent: 6621131 (2003-09-01), Murthy et al.
patent: 6989322 (2006-01-01), Gluschenkov et al.
patent: 2003/0098479 (2003-05-01), Murthy et al.
patent: 2004/0262683 (2004-12-01), Bohr et al.
patent: 2004/0262694 (2004-12-01), Chidambaram
patent: 2005/0079692 (2005-04-01), Samoilov et al.
patent: 2005/0287752 (2005-12-01), Nouri et al.
“High concentration diffusivity and clustering of arsenic and phosphorus in silicon”, S. Solmi and D. Nobili, Journal of Applied Physics, vol. 83, No. 5, Mar. 1, 1998, pp. 2484-2490.
Chakravarthi Srinivasan
Chidambaram Periannan R.
Brady III W. James
Chambliss Alonzo
Garner Jacqueline J.
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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