Phase shift correction for displacement measuring systems using

Details Phase shift correction for displacement measuring systems using Phase shift correction for displacement measuring systems using

1978-09-07

1980-11-04

McGraw, Vincent P.

Optics: measuring and testing

By polarized light examination

With light attenuation

356375, 250237G, G01B 1114, H01J 314

Patent

active

042316626

ABSTRACT:
Method and apparatus are disclosed for increasing accuracy of optical phase shift in quadrature systems by varying the angle at which light is directed through pairs of diffraction gratings. A more precise adjustment of the phase angle between two adjacent index gratings is achieved after manufacturing and assembly by using a light source and diverging or converging its rays of light. The accuracy of the phase shift of resultant signals is greatly improved over methods of mechanical alignment heretofore used. The improved accuracy allows for the manufacture of a broad tolerance system, with the inherent reduction of costs.

REFERENCES:
patent: 3487399 (1969-12-01), Wogatzke
patent: 3748486 (1973-07-01), Russell
patent: 4078173 (1978-03-01), Fultz

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