Phase-modulated polarizing interferometer

Details Phase-modulated polarizing interferometer Phase-modulated polarizing interferometer

1982-07-06

1984-11-06

Willis, Davis L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356360, G01B 902

Patent

active

044809166

ABSTRACT:
An interferometer for measuring optical surfaces which is capable of very high sensitivity. A HeNe laser light is converted into a circular polarized beam, spatially filtered and collimated. The light beam is passed through a photoelastic modulator for modulating the relative phase of the two polarization states of the optical field of the beam. The beam is then passed through a ROCHON prism which splits the beam into two orthogonally polarized components. One beam is reflected off the optical surface that is being measured and is recombined with the undeviated beam. The resulting irradiance distribution oscillates in the modulation frequency and the phase of the oscillation is dependent upon the optical path difference between the two beams. The detected interference signal is processed to extract the phase information.

REFERENCES:
patent: 3043182 (1962-07-01), Saunders
patent: 3767307 (1973-10-01), Bowker
patent: 3823604 (1974-07-01), Burch et al.
patent: 4188122 (1980-02-01), Massie et al.
patent: 4353650 (1982-10-01), Sommargren
Drain et al., "Displacement and Vibration Measurements by Laser Interferory", Proc. SPIE, vol. 136, pp. 52-57, 1977.

Affiliated with

Also associated with

Rating

Phase-modulated polarizing interferometer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Phase-modulated polarizing interferometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Phase-modulated polarizing interferometer will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1040062