Optical: systems and elements – Diffraction – From grating
Patent
1996-04-08
1998-07-28
Dzierzynski, Paul M.
Optical: systems and elements
Diffraction
From grating
359566, 359569, 359900, 430 1, 430 2, G02B 518, G02B 2744, G03H 104
Patent
active
057869316
ABSTRACT:
The phase grating of the present invention includes a substrate with a reflective, continuous layer disposed thereon on which a structured spacer layer 3 of dielectric material is applied. To form a phase grating that can be used as a scale in photoelectric position measuring instruments, a further thin reflective surface layer is located solely on the reflective, continuous surfaces, parallel to the layer, of the structured spacer layer.
REFERENCES:
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patent: 4828356 (1989-05-01), Hobrock et al.
patent: 4846552 (1989-07-01), Veldkamp et al.
patent: 5021649 (1991-06-01), Nishimura et al.
patent: 5245471 (1993-09-01), Iwatsuka et al.
patent: 5377044 (1994-12-01), Tomono et al.
Allgauer Michael
Bayer Erich
Flatscher Georg
Franz Andreas
Spanner Erwin
Chang Audrey
Dzierzynski Paul M.
Johannes Heidenhain GmbH
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