Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate
2006-04-25
2006-04-25
Lindsay, Jr., Walter L. (Department: 2812)
Semiconductor device manufacturing: process
With measuring or testing
C134S001000, C134S902000, C134S001200
Reexamination Certificate
active
07033845
ABSTRACT:
A system and method of providing RF to a transducer includes an oscillator, an RF generator, and a voltage phase detector. The oscillator has a frequency control input and an RF signal output. The RF generator has an input coupled to the oscillator RF signal output and an RF generator output coupled to the transducer. The voltage phase detector includes a first phase input coupled to the RF signal output of the oscillator, a second phase input coupled to the RF generator output, and a frequency control signal output coupled to the oscillator frequency control voltage input.
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Anderson Thomas W.
Knop Robert
Lam Research Corporation
Lindsay Jr. Walter L.
Martine & Penilla & Gencarella LLP
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