Phase contrast X-ray microscope

Details Phase contrast X-ray microscope Phase contrast X-ray microscope

1995-05-16

1996-08-27

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Telescope or microscope

378145, G21K 700

Patent

active

055508871

ABSTRACT:
An X-ray microscope has the following features: a pulsed x-ray source that delivers an intense line radiation, an annular condenser that focuses the radiation of the X-ray source on the object to be investigated, an X-ray optics constructed as a micro zone plate that images the object with high resolution on an X-ray detector, and a phase ring positioned in the rear focal plane of the micro zone plate and applies to the zero order X-ray radiation coming from the object a phase shift, with respect to the higher order radiation deflected by the object structures, which is determined by the thickness and material of the phase ring. The phase shift amounts, for example, to 90.degree. or 270.degree..

REFERENCES:
patent: 4953188 (1990-08-01), Siegel et al.
patent: 5119411 (1992-06-01), Nakamura
patent: 5204887 (1993-04-01), Hayashida et al.
patent: 5434901 (1995-07-01), Nagai et al.

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