Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2011-07-12
2011-07-12
Warren, Matthew E (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S002000, C257S003000, C257S004000, C257S311000, C257S510000, C257S903000, C257SE29141, C257SE29170, C365S148000
Reexamination Certificate
active
07977662
ABSTRACT:
A non-volatile memory array includes an array of phase-changeable memory elements that are electrically insulated from each other by at least a first electrically insulating region extending between the array of phase-changeable memory elements. The first electrically insulating region includes a plurality of voids therein. Each of these voids extends between a corresponding pair of phase-changeable memory cells in the non-volatile memory array and, collectively, the voids form an array of voids in the first electrically insulating region.
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Ko Jong-Woo
Ryoo Kyung-Chang
Song Yoon-Jong
Chen David Z
Myers Bigel & Sibley & Sajovec
Samsung Electronics Co,. Ltd.
Warren Matthew E
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