Phase change random access memory device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Junction field effect transistor

Reexamination Certificate

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Details

C257S260000

Reexamination Certificate

active

07633100

ABSTRACT:
A phase-change random access memory device includes a global bit line connected to a write circuit and a read circuit; a plurality of local bit lines, each of which being connected to a plurality of phase-change memory cells; and a plurality of column select transistors selectively connecting the global bit line with each of the plurality of local bit lines. Each column select transistor has a resistance that depends on distance from the write circuit and the read circuit.

REFERENCES:
patent: 4404660 (1983-09-01), Menachem
patent: 5751012 (1998-05-01), Wolstenholme et al.
patent: 2003/0223292 (2003-12-01), Nejad et al.
patent: 2004/0188714 (2004-09-01), Scheuerlein et al.
patent: 2004/0246808 (2004-12-01), Cho et al.
patent: 2005/0117397 (2005-06-01), Morimoto
patent: 1326258 (2003-07-01), None
patent: 9213077 (1997-08-01), None
patent: 2001160289 (2001-06-01), None

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