Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Junction field effect transistor
Reexamination Certificate
2005-12-27
2009-12-15
Smith, Bradley K (Department: 2894)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Junction field effect transistor
C257S260000
Reexamination Certificate
active
07633100
ABSTRACT:
A phase-change random access memory device includes a global bit line connected to a write circuit and a read circuit; a plurality of local bit lines, each of which being connected to a plurality of phase-change memory cells; and a plurality of column select transistors selectively connecting the global bit line with each of the plurality of local bit lines. Each column select transistor has a resistance that depends on distance from the write circuit and the read circuit.
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Cho Woo-yeong
Kim Ik-chul
Moon Young-kug
Seo Jong-soo
Samsung Electronics Co,. Ltd.
Smith Bradley K
Valentine Jami M
Volentine & Whitt P.L.L.C.
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