Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2008-07-03
2010-11-16
Pert, Evan (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S004000, C257S005000, C257S289000, C257SE29276, C365S100000, C365S148000
Reexamination Certificate
active
07834340
ABSTRACT:
Phase change memory devices are provided including a selection element electrically connected to a phase change material pattern. The selection element includes a metallic conductor and a semiconductor that are in contact with each other. A depletion region in contact with a metallic pattern is generated in the semiconductor in an equilibrium state. The depletion region includes a high barrier region having an electric potential barrier higher than an interface electric potential barrier and a low barrier region having an electric potential barrier lower than the interface electric potential barrier. Related methods are also provided.
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patent: 6261932 (2001-07-01), Hulfachor
patent: 6995446 (2006-02-01), Karpov et al.
patent: 2008/0113469 (2008-05-01), Eun et al.
patent: 1020060094424 (2006-08-01), None
patent: 1020060110559 (2006-10-01), None
Myers Bigel & Sibley & Sajovec
Pert Evan
Samsung Electronics Co,. Ltd.
Wilson Scott R
LandOfFree
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