Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2006-05-08
2009-08-04
Tran, Minh-Loan T (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S005000, C257SE45002, C977S762000
Reexamination Certificate
active
07569846
ABSTRACT:
A phase-change random access memory (PRAM) device including a plurality of nanowires and a method of manufacturing the same include: a lower structure including a plurality of contact plugs; the nanowires extending into the contact plugs from surfaces defining a respective terminal end of the contact plugs; and a phase-change layer formed on top of the nanowires. Therefore, a reset or a set current consumed by the PRAM device is significantly reduced.
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Wolf et al.. “Silicon Processing for the VLSI Era: vol. 2, Process Integration.” Lattice Press, Sunset Beach. 1990. p. 253.
Choi Chel-jong
Kim Tae-gyu
Lee Dong-woo
Park Jong-bong
Cantor & Colburn LLP
Samsung Electronics Co,. Ltd.
Tran Minh-Loan T
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