Phase change memory device having phase change material...

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material

Reexamination Certificate

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C257S003000, C257S004000, C257SE45002, C977S943000

Reexamination Certificate

active

08049202

ABSTRACT:
A phase change memory device including a phase change material layer having phase change nano particles and a method of fabricating the same are provided. The phase change memory device may include a first electrode and a second electrode facing each other, a phase change material layer containing phase change nano particles interposed between the first electrode and the second electrode and/or a switching device electrically connected to the first electrode. The phase change material layer may include an insulating material.

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Office Action Jul. 12, 2011, in corresponding Japanese Patent Application No. 2005-348039.

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