Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2009-03-06
2011-11-01
Hu, Shouxiang (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S003000, C257S004000, C257SE45002, C977S943000
Reexamination Certificate
active
08049202
ABSTRACT:
A phase change memory device including a phase change material layer having phase change nano particles and a method of fabricating the same are provided. The phase change memory device may include a first electrode and a second electrode facing each other, a phase change material layer containing phase change nano particles interposed between the first electrode and the second electrode and/or a switching device electrically connected to the first electrode. The phase change material layer may include an insulating material.
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Jo Wil-Liam
Khang Yoon-Ho
Suh Dong-Seok
Harness Dickey & Pierce PLC
Hu Shouxiang
Samsung Electronics Co,. Ltd.
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