Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2007-09-04
2007-09-04
Hoang, Quoc (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C438S095000, C257SE27004
Reexamination Certificate
active
11028841
ABSTRACT:
A method of manufacturing a memory device including forming an electrode over a substrate, then forming a dielectric feature proximate a contact region of a sidewall of the electrode, and then forming a phase change feature proximate the contact region.
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Lai Li-Shyue
Lin Wen-Chen
Tang Denny
Wang Chao-Hsiung
Haynes and Boone LLP
Hoang Quoc
Taiwan Semiconductor Manufacturing Company , Ltd.
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