Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2007-06-27
2010-10-12
Jackson, Jr., Jerome (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257SE45002
Reexamination Certificate
active
07812332
ABSTRACT:
A phase change memory device includes a current restrictive element interposed between an electrically conductive element and a phase change material. The current restrictive element includes a plurality of overlapping film patterns, each of which having a respective first portion proximal to the conductive element and a second portion proximal to the phase change material. The second portions are configured and dimensioned to have higher resistance than the first portions.
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Korean Patent Publication (English abstract) Publication No.: 1020060016312.
Lee Ki-Jong
Lim Hyun-Seok
Lim Nak-Hyun
Oh Gyu-Hwan
Park In-Sun
Budd Paul A
F. Chau & Associates LLC
Jackson, Jr. Jerome
Samsung Electronics Co,. Ltd.
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