Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2007-10-16
2009-12-29
Pert, Evan (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S004000, C257S289000, C257SE29276, C338S013000, C365S100000, C365S148000, C438S197000, C438S900000
Reexamination Certificate
active
07638788
ABSTRACT:
Provided are a phase change memory device and a method of forming the same. According to the phase change memory, a first plug electrode and a second plug electrode are spaced apart from each other in a mold insulating layer. A phase change pattern is disposed on the mold insulating layer. The phase change pattern contacts a top of the first plug electrode and a first potion of a top of the second plug electrode. An interconnection is electrically connected to a second portion of the top of the second plug electrode.
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Ahn Dong-Ho
An Hyeong-Geun
Bae Jun-Soo
Horii Hideki
Shin Jong-Chan
Mills & Onello LLP
Pert Evan
Samsung Electronics Co,. Ltd.
Wilson Scott R
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