Phase change memory device and method of forming the same

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material

Reexamination Certificate

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Details

C257S004000, C257S289000, C257SE29276, C338S013000, C365S100000, C365S148000, C438S197000, C438S900000

Reexamination Certificate

active

07638788

ABSTRACT:
Provided are a phase change memory device and a method of forming the same. According to the phase change memory, a first plug electrode and a second plug electrode are spaced apart from each other in a mold insulating layer. A phase change pattern is disposed on the mold insulating layer. The phase change pattern contacts a top of the first plug electrode and a first potion of a top of the second plug electrode. An interconnection is electrically connected to a second portion of the top of the second plug electrode.

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patent: 1020060012182 (2006-02-01), None

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