Phase-change memory cell and method of fabricating the...

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material

Reexamination Certificate

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C257SE45002, C257SE45001, C257SE47005, C216S018000, C427S058000, C438S694000

Reexamination Certificate

active

07910910

ABSTRACT:
A memory cell (and method of fabricating the memory cell) includes a stencil layer having a first opening, a phase-change material layer formed on a first electrode layer, and an electrically conductive layer formed on the first electrode layer, the electrically conductive layer having a pillar-shaped portion which is formed on the phase-change material layer and fills the first opening.

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