Static information storage and retrieval – Systems using particular element – Magnetoresistive
Reexamination Certificate
2005-05-10
2005-05-10
Elms, Richard (Department: 2824)
Static information storage and retrieval
Systems using particular element
Magnetoresistive
C365S171000
Reexamination Certificate
active
06891747
ABSTRACT:
The phase change memory cell is formed by a resistive element and by a memory region of a phase change material. The resistive element has a first thin portion having a first sublithographic dimension in a first direction; and the memory region has a second thin portion having a second sublithographic dimension in a second direction transverse to the first dimension. The first thin portion and the second thin portion are in direct electrical contact and define a contact area of sublithographic extension. The second thin portion is delimited laterally by oxide spacer portions surrounded by a mold layer which defines a lithographic opening. The spacer portions are formed after forming the lithographic opening, by a spacer formation technique.
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Bez Roberto
Pellizzer Fabio
Tosi Marina
Zonca Romina
Elms Richard
Iannucci Robert
Luu Pho M.
Ovonyx Inc.
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