Static information storage and retrieval – Systems using particular element – Resistive
Reexamination Certificate
2006-12-19
2009-11-03
Dinh, Son (Department: 2824)
Static information storage and retrieval
Systems using particular element
Resistive
C365S046000, C365S100000
Reexamination Certificate
active
07613029
ABSTRACT:
A phase change memory has a first electrode formed over a substrate, a patterned phase change material layer formed over the first electrode to contact the first electrode and including a conductive material, and a second electrode formed over the patterned phase change material layer to contact the patterned phase change material layer. Instead of heat generation, the conductive channel is used to adjust resistance while maintaining characteristics of non-volatile memories. Hence, the power consumption can be reduced. Due to no use of the phase change, the shortened lifetime of equipment for fabricating semiconductor memories, usually caused by a volume change during the phase change, can be reduced.
REFERENCES:
Non-Volatile Memory Based on Solid Electrolytes, IEEE Non-Volatile Memory Technology Symposium, at Orlando, FL, Nov. 15-17, 2004.
Byrne Harry W
Dinh Son
Dongbu Electronics Co. Ltd.
Lowe Hauptman & Ham & Berner, LLP
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