Phase change material and non-volatile memory device using...

Active solid-state devices (e.g. – transistors – solid-state diode – Including semiconductor material other than silicon or...

Reexamination Certificate

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Details

C257S003000, C257S004000, C257S005000, C257S200000, C257S246000, C438S752000

Reexamination Certificate

active

11290713

ABSTRACT:
The present invention provides a phase change memory cell comprising (GeASbBTeC)1-X(RaSbTeC)Xsolid solution, the solid solution being formed from a Ge—Sb—Te based alloy and a ternary metal alloy R—S—Te sharing same crystal structure as the Ge—Sb—Te based alloy. A nonvolatile phase change memory cell in accordance with the present invention provides many advantages such as high speed, high data retention, and multi-bit operation.

REFERENCES:
patent: 2006/0091374 (2006-05-01), Yoon et al.

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