Perpendicular magnetic recording medium

Chemistry: electrical and wave energy – Processes and products – Coating – forming or etching by sputtering

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

20419222, 427 38, 427131, 427132, 428694, 428900, G11B 564

Patent

active

048245399

ABSTRACT:
A Co-Cr perpendicular magnetic recording medium includes a chromium oxide film formed on a Co-Cr perpendicular magnetization film, and a SiO.sub.2 protective film formed on the chromium oxide film. The chromium oxide film is formed by conducting a heating treatment to the surface of the Co-Cr perpendicular magnetization film in an oxygen atmosphere of about 10 .sup.-4 to 10.sup.-3 Torr, at a temperature of about 300.degree. C. to 400.degree. C. for about two hours. The chromium oxide film has a thickness of about 20 to 200 .ANG.. The SiO.sub.2 protective film has a thickness greater than 50 .ANG., but the total thickness of the chromium oxide film and the SiO.sub.2 protective film is selected between 70 and 300 .ANG..

REFERENCES:
patent: 3498837 (1970-03-01), Alstad
patent: 4268369 (1981-05-01), Barlow
patent: 4307156 (1981-12-01), Yangisawa
patent: 4390562 (1983-06-01), Yangisawa
patent: 4454195 (1984-06-01), Fukuda
patent: 4495242 (1985-01-01), Arai
patent: 4537832 (1985-08-01), Kohmoto
patent: 4565734 (1986-01-01), Arai
patent: 4581245 (1986-04-01), Nakamura
patent: 4675240 (1987-06-01), Weiss
Journal of Magnetism and Magnetic Materials 35 (1983) 286-288.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Perpendicular magnetic recording medium does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Perpendicular magnetic recording medium, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Perpendicular magnetic recording medium will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1193905

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.