Performing early DFT-aware prototyping of a design

Details Performing early DFT-aware prototyping of a design Performing early DFT-aware prototyping of a design

2007-12-27

2010-12-14

Do, Thuan (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000, C716S030000, C714S724000

Reexamination Certificate

active

07853905

ABSTRACT:
The present invention relates to performing early design for testing (DFT)-aware prototyping of a design. Unlike prior approaches, the improvement analyzes and considers the impact of test structures at a very early stage of the design process. This allows test structures to be considered and addressed in a more efficient iterative and incremental way, which reduces design cycle time and reduces costs.

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