Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-04-10
2010-02-02
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07657857
ABSTRACT:
Methods are provided for presenting delay characteristics of a circuit design. The methods acquire routing delay data and logic delay data for each of a number of paths within the circuit design. In one method, a scatterplot of the routing delay data versus the logic delay data for each of the paths is generated and rendered. In another method, the paths are specified as being associated with modules within the circuit design. In this method, a histogram plot of the paths within each module is generated, wherein the paths within each module are identified as being dominated by routing delay or logic delay. In another embodiment, a connectivity diagram is generated to convey an amount of connectivity within modules and between modules. Each of the methods can be implemented as program instructions on a computer readable medium.
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Caranci Steven
Guzy Przemek
Altera Corporation
Dinh Paul
Martine & Penilla & Gencarella LLP
Sandoval Patrick
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