Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device
Reexamination Certificate
2007-07-19
2010-12-14
Walke, Amanda C. (Department: 1795)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making electrical device
C430S270100, C430S311000, C430S331000, C430S314000, C430S322000
Reexamination Certificate
active
07851138
ABSTRACT:
Patterning a surface, comprising at least one feature having silicon coupled to a substrate, is described herein. In one embodiment a method is described for patterning a surface which comprises at least one feature having silicon and at least one feature having carbon coupled to a substrate. The surface is coated with 3-(trimethoxysilyl)propyl methacrylate, and a photoresist is applied the 3-(trimethoxysilyl)propyl methacrylate coated surface. The photoresist is imaged and the surface is etched. The photoresist is then removed.
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Ried, et al., “Air-Bearing Sliders and Plane-Plane-Concave Tips for Atomic Force Microscope Cantilevers”,Journal of Microelectromechanical Systems, vol. 9, No. 1, Mar. 2000, 52-57.
Hwang Cherngye
McKean Dennis R.
Suzuki Gary J.
Hitachi Global Storage Technologies - Netherlands B.V.
Walke Amanda C.
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