Patterned multi-layer structure and manufacturing method

Chemistry: electrical and wave energy – Apparatus – Coating – forming or etching by sputtering

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204192EC, 204192E, 313371, 428696, 428701, 427165, G02B 528

Patent

active

043136486

ABSTRACT:
A patterned multi-layer structure for a stripe filter used for a photoelectric pickup tube, comprises a protective layer preventing a substrate from being etched by reactive sputter etching and a multi-layer optical filter formed on the protective layer patterned by reactive sputter etching into a stripe pattern.
The etching rate of the protective layer by an etching gas agent is not greater than that of the multi-layer filter.

REFERENCES:
patent: 3743586 (1973-07-01), Vossen
patent: 3914464 (1975-10-01), Thomasson et al.
patent: 4004176 (1977-01-01), Otake et al.
patent: 4029394 (1977-06-01), Araki
patent: 4030967 (1977-06-01), Ingrey et al.
H. Komiya et al., The Application of Gas Plasma . . . , IEDM Technical Digest, 1973, pp. 459-462.
John Vossen and Werner Kern, Thin Film Processes, Academic Press, New York, pp. 497-498, 526-527, 535-543.
J. R. Gardiner et al., Al.sub.2 O.sub.3 Protection of SI.sub.3 N.sub.4 During RF Sputter Etching, IBM Technical Disclosure Bulletin, vol. 13, No. 12, pp. 3657.

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