Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-05-08
2007-05-08
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
10783091
ABSTRACT:
A method for recognizing a pattern in a design of an integrated circuit (IC), comprising identifying a pattern correspondence element in a pattern instance. A pattern tree corresponding to the pattern instance is built. A list of candidate design correspondence elements in a design instance of the IC are built. Iteratively, for each design correspondence element in said list of candidate design correspondence elements each rank in a tree representation of said design instance built around said each design correspondence element is compared with corresponding rank in said pattern tree.
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Bhatia Manish
Kumar Prasoon Pratyush
Murphy Bernard
Atrenta Inc.
Chiang Jack
Doan Nghia M.
Sughrue & Mion, PLLC
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