Image analysis – Pattern recognition – Template matching
Patent
1998-06-08
2000-10-03
Au, Ameila
Image analysis
Pattern recognition
Template matching
382190, 382225, G06K 968, G06K 946, G06K 962
Patent
active
061284106
ABSTRACT:
An apparatus and method for matching sets of patterns. The apparatus matches an input pattern with reference patterns by extracting feature points of the input pattern to obtain a feature vector, and compares the feature vector of the input pattern with previously stored feature vectors of the reference patterns. The apparatus selects a reference pattern from a database and calculates the distance and direction between the input pattern and the selected reference pattern, to thereby include the reference pattern whose distance from the input pattern is equal to or less than a first threshold value in a matching comparison target, and determines whether the selected reference pattern and its neighbor reference patterns are included in the matching comparison target in consideration of the direction of the neighbor reference patterns with respect to the reference pattern, located within a circle having the point of the selected reference pattern as its center, if the distance between the input pattern and the selected reference pattern is greater than the first threshold value and the difference between the distance and the first threshold value is equal to or less than a second threshold value; and matches the patterns determined as the matching comparison target by the pattern classifier with the input pattern. Effective reference patterns are dynamically selected considering the direction and distance between the input pattern and the reference patterns, thus improving the accuracy and speed of pattern matching.
REFERENCES:
patent: 5621863 (1997-04-01), Boulet et al.
patent: 5647058 (1997-07-01), Agrawal et al.
patent: 5657397 (1997-08-01), Bokser
patent: 5901244 (1999-05-01), Souma et al.
Doh Jeong-in
Park Hee-seon
Au Ameila
Dastouri Mehrdad
Samsung Electronics Co,. Ltd.
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