Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate
2005-01-14
2010-12-14
Sandvik, Benjamin P (Department: 2826)
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
C438S700000
Reexamination Certificate
active
07851363
ABSTRACT:
A pattern forming method includes forming a spin on dielectric film on a substrate, washing the spin on dielectric film by using a washing liquid, drying a surface of the spin on dielectric film after the washing, forming a photosensitive film on the dried coating type insulation film, emitting energy rays to a predetermined position of the photosensitive film in order to form a latent image on the photosensitive film, developing the photosensitive film in order to form a photosensitive film pattern which corresponds to the latent image, and processing the spin on dielectric film with the photosensitive film pattern serving as a mask.
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Ito Shin'ichi
Kato Hirokazu
Takeishi Tomoyuki
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Kabushiki Kaisha Toshiba
Sandvik Benjamin P
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