Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Simultaneous developing a resist image and etching a subtrate
Patent
1987-03-27
1989-04-25
Schilling, Richard L.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Simultaneous developing a resist image and etching a subtrate
430296, 430323, 430324, 430326, G03F 716, G03F 726
Patent
active
048247669
ABSTRACT:
A method of forming any film pattern on an arbitrary substrate, more particularly, a pattern forming method which comprises selectively forming a film on an arbitrary substrate, by use of chemical reaction, and further, a method of forming a pattern of an organic film by selectively removing the organic film at a lower layer, with the pattern of the Langmuir-Blodgett's film containing Si as a mask.
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Matsushita Electric - Industrial Co., Ltd.
Schilling Richard L.
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