Pattern formation method through liquid immersion lithography

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making printing plates

Reexamination Certificate

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C430S309000, C430S311000, C430S322000, C430S330000, C430S945000

Reexamination Certificate

active

07470501

ABSTRACT:
An exposure system includes an exposure section provided within a chamber for irradiating a resist film formed on a wafer with exposing light through a mask with an immersion liquid provided on the resist film. It further includes a drying section for drying the surface of the resist film after the irradiation.

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Tanaka et al “Freeze-Dryining Process to Avoid Resist Pattern collapse” Jpn J. Phys. vol. 32 (1993) pp. 5813-5814, Part 1, No. 12A, Dec. 1993.

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