Patch-clamping and its use in analyzing subcellular features

Radiant energy – Inspection of solids or liquids by charged particles

Reexamination Certificate

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Details

C250S307000

Reexamination Certificate

active

07057171

ABSTRACT:
The present invention pertains to a method for investigating a cell, comprising bringing a probe close to the surface of the cell or part thereof, at a controlled distance therefrom; and into contact with the surface, essentially normal to the surface, to achieve patch-clamping.

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Korchev, Y.E., et al. “Specialized scanning ion-conductance microscope for imaging of living cells,”J. Microscopy, 1997, pp. 17-23, vol. 188, No. 1.
Korchev, Y.E., et al. “Scanning ion conductance microscopy of living cells,”Biophys. J., 1997, pp. 653-658, vol. 73, No. 1.

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