Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-01-25
2005-01-25
Kang, Donghee (Department: 2811)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
06848091
ABSTRACT:
Some embodiments of the invention are placers that use lines that are not orthogonal with each other to calculate the costs of potential placement configurations. Some of these embodiments use non-orthogonal lines to measure congestion costs of potential placement configurations. For instance, some embodiments use non-orthogonal lines as cut lines that divide the IC layout into regions. These embodiments then generate congestion-cost estimates by measuring the number of nets cut by the cut lines.
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Fang, S. et
Ganley Joseph L.
Teig Steven
Cadence Design Systems Inc.
Kang Donghee
Stattler, Johansen and Adeli LLP
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