Measuring and testing – Gas analysis – Solid content of gas
Patent
1997-08-18
2000-07-04
Brock, Michael
Measuring and testing
Gas analysis
Solid content of gas
7386321, G01N 1506, G01N 124
Patent
active
060821795
ABSTRACT:
A particle measurer used in a semiconductor clean room includes a funnel-shaped collector for facilitating the measurement of a particle level of an air sample in the clean room. The particle measurer is arranged so that a narrow end part of the funnel-shaped collector is connected to an intake of the particle measurer. A wide end of the funnel-shaped connector receives the air sample through a sample air pipe. A pump is used for suctioning the air sample through the intake of said particle counter and for discharging the air sample through an exhaust.
REFERENCES:
patent: 3070990 (1963-01-01), Krinov
patent: 3759617 (1973-09-01), Barringer
patent: 3780567 (1973-12-01), Ovard
patent: 4137751 (1979-02-01), Rhodes et al.
Choi Jae Heung
Jeon Jae Kang
Kim Dong Young
Lee Joung Sun
Brock Michael
Samsung Electronics Co,. Ltd.
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