Particle beam system having a mirror corrector

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens

Reexamination Certificate

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Details

C250S398000, C250S298000, C250S305000, C250S311000, C250S310000, C313S359100

Reexamination Certificate

active

06855939

ABSTRACT:
The invention relates to a particle beam system comprising a particle source (1), a mirror corrector (9, 21to25), and an objective lens (16). The mirror corrector comprises an electrostatic mirror (9) and a magnetic beam deflector (21, 22, 23, 24, 25), which is arranged between the particle source (1) and the electrostatic mirror (9) as well as between the electrostatic mirror (9) and the objective lens (16). The magnetic beam deflector (21, 22, 23, 24, 25) is free from dispersion for each single pass. The magnetic beam deflector (21, 22, 23, 24, 25) also comprises quadrupoles and/or quadrupole components, which are provided in such a manner that a maximum of two planes, which are conjugated with regard to the diffraction plane (28) of the objective lens (16), occur on the entire path length between the first outlet from the magnetic beam deflector (21, 22, 23, 24, 25) and from the objective lens (16).

REFERENCES:
patent: 2161466 (1939-06-01), Henneberg
patent: 3660658 (1972-05-01), Leboutet et al.
patent: 4107526 (1978-08-01), McKinney et al.
patent: 4367406 (1983-01-01), Franzen et al.
patent: 4866272 (1989-09-01), Aoki
patent: 5177361 (1993-01-01), Krahl et al.
patent: 5319207 (1994-06-01), Rose et al.
patent: 5336885 (1994-08-01), Rose et al.
patent: 5449914 (1995-09-01), Rose et al.
patent: 5644132 (1997-07-01), Litman et al.
patent: 5986269 (1999-11-01), Krijn et al.
patent: 6097028 (2000-08-01), Tsuno
patent: 6150657 (2000-11-01), Kimoto et al.
patent: 6239430 (2001-05-01), Weimer et al.
patent: 6307205 (2001-10-01), Tsuno
patent: 6384412 (2002-05-01), Krahl et al.
patent: 6522056 (2003-02-01), Mauck
patent: 6576908 (2003-06-01), Winkler et al.
patent: 6611087 (2003-08-01), Mauck
patent: 39 31 970 (1991-04-01), None
“Corrected Low-Energy Electron Microscope for Multi-Mode Operation”, D. Preikszas et al, Institute of Applied Physics, Darmstadt, Germany, pp. 197-198.
“Time-dependent perturbation formalism for calculating aberrations of systems with large ray gradients”, H. Rose et al, Nuclear Instruments and Methods in Physics Research A 363 (1995), pp. 301 to 315.

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