Partial good schema for integrated circuits having parallel...

Details Partial good schema for integrated circuits having parallel... Partial good schema for integrated circuits having parallel...

2009-01-30

2010-06-15

Chiang, Jack (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

07739637

ABSTRACT:
Processing engines (PE's) disposed on the substrate. Each processing engine includes a measurement and storage unit, and a PE controller coupled to each of the processing engines. The processing engines perform self-tests and store the results of the self-tests in the measurement and storage unit. The PE controller reads the results and selects a sub-set of processing engines based on the results and an optimization algorithm.

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U.S. Appl. No. 11/848,278, “Office Action”, Jul. 16, 2009, 10 pages.
U.S. Appl. No. 11/848,278, Notice of Allowance & Fees Due, Dec. 15, 2009, 12 pages.

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