Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2007-03-13
2007-03-13
Le, Dieu-Minh (Department: 2114)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C717S143000
Reexamination Certificate
active
10241022
ABSTRACT:
An invention is disclosed for providing methods for parsing test results having diverse formats. Test results from executed test suites are identified. Test result formats of the test results are categorized. An order of the test results is tracked. A chain of parsers is assembled from individual parsers such that each individual parser is charged with parsing a particular test result format. Test results are parsed such that the data features that define attributes of the test results are identified where the attributes define pass, fail, and comments associated with the pass or fail.
REFERENCES:
patent: 2002/0078216 (2002-06-01), Pankovcin et al.
patent: 2002/0141449 (2002-10-01), Johnson
patent: 2003/0131085 (2003-07-01), Zhang et al.
patent: 2004/0205565 (2004-10-01), Gupta
patent: 2 213 457 (1997-05-01), None
patent: WO 92/03782 (1991-10-01), None
Boudnik Konstantin I.
Volkov Alexei
Zhang Weiqiang
Le Dieu-Minh
Martine & Penilla & Gencarella LLP
Sun Microsystems Inc.
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