Parametric measurement unit/device power supply for semiconducto

Details Parametric measurement unit/device power supply for semiconducto Parametric measurement unit/device power supply for semiconducto

1990-03-08

1991-10-22

Wong, Peter S.

Electricity: power supply or regulation systems

Output level responsive

Using a three or more terminal semiconductive device as the...

323275, 323281, 323283, H02M 3335

Patent

active

050598899

ABSTRACT:
Disclosed is a device power supply in a semiconductor test system for supplying programmed test pattern voltages to a semiconductor device under test and for current range switching of current range resistors without effecting the output voltage of the device power supply.

REFERENCES:
patent: 4885674 (1989-12-01), Varga et al.
Luther K. Horning et al., Measurements of Quiescent Power Supply Current for CMOS ICs in Production Testing, 1987 International Test Conference, pp. 300-309.
Charles Crapuchettes, Testing CMOS I.sub.DD on Large Devices, 1987 Internal Test Conference, pp. 310-315.
Mike Keating & Dennis Meyer, A New Approach to Dynamic IDD Testing, 1987 International Test Conference, pp. 316-321.

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