Parametric analyzing method for calculating light intensity

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing

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700 47, 700 52, 700 74, 700109, 700115, 700129, 355 53, 355 55, 355 67, 355 71, 356401, G06F 1900, G06G 766

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060526262

ABSTRACT:
The order of optical conditions and mask conditions necessary required in a photolithography process to be varied is designated so as to minimize the number of recalculations for a transmission cross-coefficient and a Fourier transform of a mask. The conditions are systemically varied and Fourier transforms of the mask and the transmission cross-coefficients are tabulated. With the resultant tables, the parametric analysis for calculating the light intensity distribution is performed.

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"Optical Technology Contact", vol. 28, No. 3, 1990 pp. 165-175 (with Translation).

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