Parameter measurement of semiconductor device from pin with...

Details Parameter measurement of semiconductor device from pin with... Parameter measurement of semiconductor device from pin with...

2007-07-17

2007-07-17

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C365S201000

Reexamination Certificate

active

10987706

ABSTRACT:
A semiconductor device includes an ODT (on die termination) pin coupled to a tester that applies a tester termination control signal thereon. The semiconductor device also includes a measure path that transmits the tester termination control signal from the ODT pin to an ODT circuit during measurement of a parameter of the semiconductor device. The ODT pin and the measure path advantageously allow for control of the ODT circuit by the tester for more accurate parameter characterization.

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Korean Patent Publication No. 010065681 having Publication date of Jul. 11, 2001 (w/ English Abstract page).
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Japanese Patent Publication No. JP2003068082 having Publication date of Feb. 27, 2003 (w/ English Abstract page).

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