4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Jung Sunwoo

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Parameter measurement of semiconductor device from pin with...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Refresh circuit and refresh method in semiconductor memory...

Electrical computers and digital processing systems: memory – Storage accessing and control – Specific memory composition
Reexamination Certificate

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Voltage controlled oscillator and PLL having the same

Oscillators – Ring oscillators
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3057323

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