Electronic digital logic circuitry – Multifunctional or programmable – Having details of setting or programming of interconnections...
Patent
1996-04-16
1998-05-12
Hudspeth, David R.
Electronic digital logic circuitry
Multifunctional or programmable
Having details of setting or programming of interconnections...
326 41, 3241581, H03K 19177
Patent
active
057511632
ABSTRACT:
An automatic tester is provided to simultaneously program PLDs organized in device chains, so as to minimize programming time and to maximize utilization of the tester pins. Various configurations which allow parallel programming of device chains are provided for device chains using the same programming convention, e.g. in-system programming (ISP) convention. Various configuration which allow parallel programming of device chains using different programming conventions, such as BSCAN and ISP conventions, are provided.
REFERENCES:
patent: 5237219 (1993-08-01), Cliff
patent: 5457408 (1995-10-01), Leung
patent: 5493239 (1996-02-01), Zlotnick
patent: 5528600 (1996-06-01), El Ayat et al.
patent: 5543730 (1996-08-01), Cliff et al.
"Lattice In-System Programmability Manual 1994", Lattice Semiconductor Corporation.
Parker Daniel V.
Tang Howard
Hudspeth David R.
Kwok Edward C.
Lattice Semiconductor Corporation
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