Static information storage and retrieval – Floating gate – Multiple values
Reexamination Certificate
2007-11-20
2007-11-20
Hoang, Huan (Department: 2827)
Static information storage and retrieval
Floating gate
Multiple values
C365S185210, C365S185170
Reexamination Certificate
active
11228194
ABSTRACT:
According to one aspect, a memory cell array includes a bit line connected to a plurality of nonvolatile memory cells, where the nonvolatile memory cells are selectively programmable in any one of at least first, second, third and fourth threshold voltage states, and where the first, second, third and fourth threshold voltage states correspond to four different data values defined by first and second bits. A page buffer circuit stores a logic value as main latch data and is responsive to a main latch signal to selectively flip the logic value of the main latch data according to a voltage level of the bit line. A sub-latch circuit stores a logic value as sub-latch data and is responsive to a sub-latch signal to selectively flip the logic value of the sub-latch data according to the voltage level of the bit line. The memory device is operable in a read mode which reads the threshold voltage state of the non-volatile memory cells and a programming mode which programs the threshold voltage state of the non-volatile memory cells, wherein the page buffer circuit is selectively responsive to the sub-latch data to inhibit flipping of the logic value of the main latch data in the programming mode.
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patent: 6278636 (2001-08-01), Lee
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patent: 7120051 (2006-10-01), Gorobets et al.
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patent: 1020030033679 (2003-05-01), None
Chae Dong-Hyuk
Cho Hyun-Chul
Lee Sung-Soo
Lim Young-Ho
Hoang Huan
Samsung Electronics Co,. Ltd.
Volentine & Whitt PLLC
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