Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent
1991-12-26
1994-09-13
Mintel, William
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
257203, 257208, H01L 2302
Patent
active
053471458
ABSTRACT:
A semiconductor device comprises a rectangular semiconductor chip provided with an integrated circuit, and a plurality of voltage stress examination pads formed on the semiconductor chip for applying stress examination voltage to the integrated circuit, and having the same function, wherein the voltage stress examination pads are provided on opposite sides of the semiconductor chip.
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Koyanagi Masaru
Tanaka Hiroaki
Kabushiki Kaisha Toshiba
Mintel William
Potter Roy
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