Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Ball or nail head type contact – lead – or bond
Reexamination Certificate
2006-07-12
2008-12-30
Lorengo, Jerry (Department: 1793)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Ball or nail head type contact, lead, or bond
C257S777000, C257S778000, C257S737000, C228S110100, C438S108000
Reexamination Certificate
active
07470996
ABSTRACT:
A packaging method includes ultrasonically bonding a semiconductor device and a substrate together via bumps that include gold as a main component thereof. A contact surface of a primary bump on a surface of an aluminum pad on one side of the substrate contacts and is ultrasonically bonded to a distal end surface of each opposed secondary bump on one side of the semiconductor device. An area of the contact surface is larger than that of the opposed distal end surface. By this method, damage to the substrate from the ultrasonic can be reduced without using a reinforcing layer.
REFERENCES:
patent: 5341979 (1994-08-01), Gupta
patent: 6425516 (2002-07-01), Iwatsu et al.
patent: 6426556 (2002-07-01), Lin
patent: 6713844 (2004-03-01), Tatsuta et al.
patent: 2002/0151228 (2002-10-01), Kweon et al.
patent: A-2000-150573 (2000-05-01), None
patent: A-2001-298342 (2001-10-01), None
patent: A-2005-79211 (2005-03-01), None
patent: WO98/58409 (1998-12-01), None
Tan et al. Thermosonic Flip-chip Bonding Using Longitudinal Ultrasonic Vibration. IEEE Electronic Components and Technology Conference, May 18-21, 1997.
Abe Ryuichiro
Kayukawa Kimiharu
Makino Nobuya
Yoneyama Takao
DENSO CORPORATION
Lorengo Jerry
Posz Law Group , PLC
Wiese Noah S
LandOfFree
Packaging method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Packaging method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Packaging method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4045003