Package stress management

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Encapsulating

Reexamination Certificate

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Details

C438S124000, C438S126000, C438S108000, C438S118000, C438S613000, C257SE21502, C257SE21503, C257SE21499

Reexamination Certificate

active

11282255

ABSTRACT:
Numerous embodiments of an apparatus and method to stress and warpage of semiconductor packages are described. In one embodiment, a semiconductor die is disposed above a substrate. An encapsulating material is disposed above the substrate and semiconductor die, in which the encapsulating material has a combination of a low coefficient of thermal expansion material and a high coefficient of thermal expansion material.

REFERENCES:
patent: 5036024 (1991-07-01), Mine et al.
patent: 5274913 (1994-01-01), Grebe et al.
patent: 5331205 (1994-07-01), Primeaux
patent: 5436203 (1995-07-01), Lin
patent: 5641997 (1997-06-01), Ohta et al.
patent: 5807768 (1998-09-01), Shin
patent: 6143432 (2000-11-01), de Rochemont et al.
patent: 6221509 (2001-04-01), Hirano et al.
patent: 6372619 (2002-04-01), Huang et al.
patent: 6600234 (2003-07-01), Kuwabara et al.
patent: 6745462 (2004-06-01), Rutiser
patent: 6861683 (2005-03-01), Rissing et al.
patent: 09027573 (1997-01-01), None
patent: 423128 (2001-02-01), None

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