Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Encapsulating
Reexamination Certificate
2007-02-20
2007-02-20
Baumeister, B. William (Department: 2891)
Semiconductor device manufacturing: process
Packaging or treatment of packaged semiconductor
Encapsulating
C438S124000, C438S126000, C438S108000, C438S118000, C438S613000, C257SE21502, C257SE21503, C257SE21499
Reexamination Certificate
active
11282255
ABSTRACT:
Numerous embodiments of an apparatus and method to stress and warpage of semiconductor packages are described. In one embodiment, a semiconductor die is disposed above a substrate. An encapsulating material is disposed above the substrate and semiconductor die, in which the encapsulating material has a combination of a low coefficient of thermal expansion material and a high coefficient of thermal expansion material.
REFERENCES:
patent: 5036024 (1991-07-01), Mine et al.
patent: 5274913 (1994-01-01), Grebe et al.
patent: 5331205 (1994-07-01), Primeaux
patent: 5436203 (1995-07-01), Lin
patent: 5641997 (1997-06-01), Ohta et al.
patent: 5807768 (1998-09-01), Shin
patent: 6143432 (2000-11-01), de Rochemont et al.
patent: 6221509 (2001-04-01), Hirano et al.
patent: 6372619 (2002-04-01), Huang et al.
patent: 6600234 (2003-07-01), Kuwabara et al.
patent: 6745462 (2004-06-01), Rutiser
patent: 6861683 (2005-03-01), Rissing et al.
patent: 09027573 (1997-01-01), None
patent: 423128 (2001-02-01), None
Matayabas, Jr. James C.
Oskarsdottir Gudbjorg H.
Patel Mitesh C.
Anya Igwe U.
Baumeister B. William
Blakely , Sokoloff, Taylor & Zafman LLP
Intel Corporation
LandOfFree
Package stress management does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Package stress management, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Package stress management will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3864276